Starting with an introduction to the OmniScan X3 flaw detector and its new FMC/TFM capabilities, this series of 5 webinars provides useful information on various topics related to total focusing method (TFM) imaging. Advanced inspection tools that enable more efficient, effective, and code-compliant TFM inspections will be presented throughout the sessions. ■ Confidence You Can See—Introducing the OmniScan™ X3 PAUT/TFM Flaw Detector, January 22 last, watch on-demand ■ The Basics of the Total Focusing Method (TFM), February 12 ■ Acoustic Influence Map (AIM)—The Modeling Tool for Your TFM Inspection, March 4​ ■ Total Focusing Method (TFM) vs Phased Array (PAUT)—When to Use Each Method, March 25 ■ Ensuring Code Compliance While Using the Total Focusing Method, April 15 Our presenters are: Tommy Bourgelas, Senior Product Manager—OmniScan Product Line Emilie Peloquin, Global Advanced Product Support Manager